3D vibrating probe for measuring microfeatures with nanometer uncertainty, in: 56. IWK - Internationales Wissenschaftliches Kolloquium
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Autor Riel, Martijn van; Bos, Edwin
Publicat  TU Ilmenau, Ilmenau, 2011
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2000 şi ulterior
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no fulltext found 56. IWK - Internationales Wissenschaftliches Kolloquium | 56. IWK - International Scientific Colloquium
Autor: Pufke, Michael; Hilbrunner, Falko; Diethold, Christian; Fröhlich, Thomas; Schalles, Marc; Blumröder, Götz; Augustin, Silke; Mammen, Helge; Irrgang, K.; Meiselbach, U.; Rizzuti, Sergio; Rosa, Raffaele; Tkatchenko, O.; Tkachenko, R.; Hirniak, Y.; Orest, Ivakhiv; Mushenyk, Petro; Böhm, V.; Jentzsch, Alexander; Kaufhold, Tobias; Schneider, F.; Zimmermann, Klaus; Wendt, Gudrun; Ahlers, Franz Josef; [...]
Publicat: 2011
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Documents: 56. IWK - Internationales Wissenschaftliches Kolloquium
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DMG-Lib FaviconDMG-Lib https://www.dmg-lib.org/dmglib/handler?docum=29446009
Europeana FaviconEuropeana  http://www.europeana.eu/portal/record/2020801/dmglib_handler_docum_29446009.html
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ITUIlmenau TU  http://www.tu-ilmenau.de
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Time of publication 2011

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