Das streulichtoptische Defektmodell zur Bestimmung der Mikrotopografie von mechanisch bearbeiteten Halbleiter-Oberflächen, in: 44. IWK - Internationales Wissenschaftliches Kolloquium
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Author Hertzsch, Albrecht; Hammer, Ralf
Published  TU Ilmenau, Ilmenau, 1999
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1950-1999
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no fulltext found 44. IWK - Internationales Wissenschaftliches Kolloquium : 44. IWK - International Scientific Colloquium
Author: Airila, Mauri; Kallenbach, Eberhard; Parkin, Robert M.; Franke, Hans-Joachim; Brix, Torsten; Sperlich, Horst; Höhne, Günter; Micke, Derk; Schorcht, Hans-Jürgen; Wauro, Frank; Carvalho Ferreira, José M. G.; Mateus, Artur J. S.; Seeger, Hartmut; Peter, Frank; Uhlmann, Johannes; Deter, Christhard; Kochsiek, Manfred; Odin, Andreas; Jäger, Gerd; Krause, Frank-Lothar; Kaufmann, U.; Schumann, G.; [...]
Published: 1999
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Documents: 44. IWK - Internationales Wissenschaftliches Kolloquium
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DMG-Lib FaviconDMG-Lib https://www.dmg-lib.org/dmglib/handler?docum=26534009
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ITUIlmenau TU  http://www.tu-ilmenau.de
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Time of publication 1999

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