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Approaching nanometre accuracy in large plane mirror’s profile deviation measurement, in: 56. IWK - Internationales Wissenschaftliches Kolloquium
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Informations générales |
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| Auteur | Müller, Andreas; Hofmann, Norbert; Manske, Eberhard |
| Publié | TU Ilmenau, Ilmenau, 2011 |
| Edition | |
| Extension | |
| ISBN | |
| 2000 et après |
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56. IWK - Internationales Wissenschaftliches Kolloquium | 56. IWK - International Scientific Colloquium Auteur: Pufke, Michael; Hilbrunner, Falko; Diethold, Christian; Fröhlich, Thomas; Schalles, Marc; Blumröder, Götz; Augustin, Silke; Mammen, Helge; Irrgang, K.; Meiselbach, U.; Rizzuti, Sergio; Rosa, Raffaele; Tkatchenko, O.; Tkachenko, R.; Hirniak, Y.; Orest, Ivakhiv; Mushenyk, Petro; Böhm, V.; Jentzsch, Alexander; Kaufhold, Tobias; Schneider, F.; Zimmermann, Klaus; Wendt, Gudrun; Ahlers, Franz Josef; [...] Publié: 2011 |
| Documents: |
56. IWK - Internationales Wissenschaftliches Kolloquium |
 DMG-Lib |
 https://www.dmg-lib.org/dmglib/handler?docum=29425009 |
|
 Europeana |
 http://www.europeana.eu/portal/record/2020801/dmglib_handler_docum_29425009.html |
 Ilmenau TU |
http://www.tu-ilmenau.de |
| Time of publication | 2011 |
