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Lehmann, Peter
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No information available
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variant spelling:
Lehmann, Peter
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Einsatz von Specklekorrelationsverfahren zur Charakterisierung von technischen Oberflächen, in: 44. IWK - Internationales Wissenschaftliches Kolloquium
Author: Ciossek, Andreas; Peters, Jörg; Lehmann, Peter; Patzelt, Stefan; Goch, Gerd
Published: 1999
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Low coherent Linnik interferometer optimized for use in Nano Measuring Machines, in: 56. IWK - Internationales Wissenschaftliches Kolloquium
Author: Niehues, Jan; Lehmann, Peter; Xie, Weichang
Published: 2011
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