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Fiedler, S.


 
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Fiedler, S.
   
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Automation, since 1950
Literature
 
thumbnail of29477009 High resolution slope measuring deflectometry for the characterization of ultra-precise reflective X-ray optics, in: 56. IWK - Internationales Wissenschaftliches Kolloquium
Author: Siewert, Frank; Buchheim, Jana; Höft, T.; Fiedler, S.; Bourenkov, G.; Cianci, M.; Signorato, R.
Published: 2011
 
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